中文簡體
English
IV + EL Solar Cell Automatic Sorting Machine
Product Introduction： This equipment is mainly used to simulate sunlight and collect the I-V characteristic curves of crystalline silicon photovoltaic cells. It adopts a long-arc pulsed xenon lamp as the transient light source, and the light source grade meets the IEC60904-9 ed3 A+A+A+ grade. It can measure the I-V curves, P-V curves, irradiance lines, short-circuit current, open-circuit voltage, peak power, peak power point voltage and current, fill factor, conversion efficiency, series resistance, and parallel resistance of conventional polycrystalline, monocrystalline Perc, Topcon, BC, heterojunction and other high-capacitance cells.
Key Parameters
Standard
IEC60904-9:2020
Light type
Pulsed xenon lamp
Light source lifetime
≥2000000
Spectrum wavelength
300-1200nm
Classification of light source
Spectral match is 0.875-1.125, class A+
Non-uniformity is ≤1%, class A+
Instability is ≤1%, class A+
Non-uniformity is ≤1%, class A+
Instability is ≤1%, class A+
Irradiance intensity
200W/㎡~1200W/㎡
Illumination area
? 240*240mm
? Other size is customizable
? Other size is customizable
Repeatability
≤0.03%
Pulse duration
10-100ms, in step of 1ms
Testing technology
Standard features include I-V and V-I sweep, integrated advanced hysteresis testing mode, intelligent testing technology (IAT), and dark field measurement capabilities
Measurable Cell type
Conventional polysilicon, PERC , TOPCon , BC , HJT, CIGS, GaAs, and CdTe cells
Capacity
≥2200pcs/h, higher speed machine is customizable
Postioning
Optical positioning
Material loading
2 Bins
Material unloading
4 Bins, taking by Bernoulli vacuum sucker
Optional service
? Rear side light is designed for measurement of bifacial solar cells
? EL testing system can achieve IV and EL testing at a same production section
? AOI testing system, to realize automatic sorting of color
? Integrated with IR infrared thermal imager to realize heat spot testing
? Double channels testing technology, to achieve simultaneous testing of two half-cut
cells
? EL testing system can achieve IV and EL testing at a same production section
? AOI testing system, to realize automatic sorting of color
? Integrated with IR infrared thermal imager to realize heat spot testing
? Double channels testing technology, to achieve simultaneous testing of two half-cut
cells
