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Product Introduction： The Xenon Lamp Steady State I-V tester uses xenon lamp as a steady state light source for IV testing of crystalline silicon, perovskite and laminated cells and their corresponding components. The equipment is mainly equipped with light source control system, power supply control system, test system, constant temperature system, infrared temperature probe, reference battery, computer, display and so on. The equipment can realize the standard I-V, V-I scanning mode, with MPPT (maximum power point tracking), I-t (constant voltage) and other test technologies. Can obtain I-V curve, P-V curve, irradiance curve, short circuit current, open circuit voltage, peak power, peak power point voltage, current, constant voltage point current, fill factor, conversion efficiency, series resistance, parallel resistance and other test parameters.
Key Parameters
Non-uniformity is ≤2%, class A
Instability is ≤1%, class A+
? 300*300mmu000b? 320*320mm
? Other size is customizable
MPPT (Maximum Power Point Tracking), I-t (constant voltage testing), Dynamic measurement, and integrated point-by-point scanning (with minimum step ≤0.2s ).
all these technologies is switchable by software
to achieve temperature coefficient
? Integrated multi-channel acquisition system (number of channels are customizable)
? EL testing system can achieve IV and EL
testing at a same production section
? Jigs for 0BB cells and perovskite cells are
customizable
? Integrated with IR infrared thermal imager
to realize heat spot testing
? Glove box（MIKROUNA）
